Joint Technical Event from IEEE EMC Society German Chapter and Rohde & Schwarz

IEEE EMC Society Distinguished Lecturer, Term 2024-2025
Senior Director for Systems Developments and Project Implementations, Rohde & Schwarz

EMC-S Distinguished Lecture: How Close Can Far-Field Be? Getting the Best Out of Your Measurement Range

Trends in modern wireless communications, including the use of massive MIMO and millimeter wave frequencies, have supported an increased deployment of electrically large antennas. This created technical and economic challenges as many EMC, or regulatory tests require a far-field condition. This talk provides an overview of the recent findings in defining the shortest possible far-field test distance, depending on the size of the device under test, its operation frequency, the target metric, and the upper bound acceptable measurement deviation. Practical ways are also described to determine the maximum antenna aperture size that can be tested in the far-field at a given frequency and for a maximum error, in an existing chamber with a defined range length.

R&D Hardware and Solutions - Antenna Test, Rohde & Schwarz

Adam Tankielun earned his Master of Science in Engineering (mgr inż.) in electrical engineering from the Technical University of Gdańsk in 2002, followed by his Doctor of Engineering (Dr.-Ing.) degree from Leibniz University Hannover in 2007. Between 2003 and 2008, he enhanced his expertise at the Fraunhofer Institute for Reliability and Micro integration in Paderborn, focusing on the development of electromagnetic near-field scanning techniques. Since 2008, he has been with Rohde & Schwarz in Munich, where he specializes in the development of broadband measurement antennas and over-the-air test systems for antennas and wireless devices. Dr. Tankielun is an inventor, with a portfolio of over 40 patents to his name.