21 Results
New technologies and applications like 6G communications and sensing extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.
12-Dec-2023
Comprehensive test solutions guide for production and R&D
Small cell is a compact base station with smaller form factor and lower transmission power in comparison to the conventional macro base station. It covers relatively small area and serves less users. Usually, small cell can be integrated into the existing mobile network. By the evolution of radio access technology, the role of small cell has been changing through the evolution path. In the 2G/3G time, its role was to provide coverage in corner cases. Later during LTE, networks are not just providing coverage but capacity too. Small cells were then used to provide the addition capacity where required without adding additional spectrum. Now in 5G era, network operators use densification as an important strategy to provide seamless 5G services which demand coverage, capacity and performance too. With use cases requiring the 5G millimeter wave (mmW) rollouts, it makes sense to use small cells for densification due to the propagation characteristics of mmW.In this application note, we will shed light on the testing aspects of a small cell throughout the product life cycle with particular focus on the production test solution for the small cell device under test (DUT) in FR2 (frequency range 2, mmW frequency band) in Over the Air (OTA) environment for option 6 split based on radio communication tester R&S®CMP200 and OTA chamber R&S®CMQ200. The document is complemented with more insights into test solutions used in typical R&D test applications towards the second half of the application note.
19-Jun-2023 | AN-No. 1SL395
In high-speed digital measurement applications, test fixtures are commonly used to connect devices under test to measurement equipment. Characterization, and analysis in the time and frequency domains that accounts for various constraints helps to remove the influence of these fixtures.
23-May-2023 | AN-No. 1SL393
The R&S®ZNA vector network analyzer with integrated LO output and direct IF input options is a simple, cost-effective solution for 2-port and 4-port measurements using Rohde & Schwarz mmWave converters.
27-Apr-2023
Harmonic load pull measurements explore potential device efficiency to find the best design topology.
17-Apr-2023
For measurements of non-connectorized devices, test fixtures, probes or other structures are used to adapt from the coaxial interface of the test setup to the device under test (DUT). For accurate measurements of the DUT, these lead-ins and lead-outs need to be characterized, so that their effects can be mathematically removed, i.e. de-embedded from the measurement results.This application note provides practical hints to accurately characterize and de-embed these lead-in and lead-out structures with R&S Vector Network Analyzers ZNA, ZNB, ZNBT and ZND. As de-embedding is also essential in other test equipment like oscilloscopes, etc., this guide also describes, how lead-ins and lead-outs can be accurately characterized with a VNA and then exported as an S-Parameter file to be used by other test instruments.
19-Sep-2022 | AN-No. 1SL367
RF components, On-wafer, Early wafer-level qualification, Early wafer-level qualification of RF components ensures quality and saves money On-wafer qualification of RF components RF components, On-wafer, Early wafer-level qualification, Early wafer-level qualification of RF components ensures quality and saves money On-wafer qualification of RF components RF components, On-wafer, Early wafer-level
14-Jul-2022
With continuously increasing data rates, signal integrity in high speed digital designs becomes more and more demanding
08-Jul-2022
RF system noise contributions define receiver capabilities and sensitivity. The noise figure measures how the critical components affect the signal.
28-Jan-2022
Noise figure is an important parameter that describes the noise contribution of an electronic device. A classical approach to measure the noise figure is to use a noise source which delivers two different input noise powers by switching between a “hot” and a “cold” state and a noise receiver (e.g. a spectrum analyzer).In contrast to this approach, using a vector network analyzer with the “Cold Source” approach eliminates the need for a noise source. A cold source noise power measurement followed by an available gain measurement of the device under test is sufficient to determine the noise figure of the device. This application note describes the “Cold Source” technique for measuring noise figure on the R&S®ZNA family of vector network analyzers.Background equations are provided for an analysis of noise factor, noise figure and noise temperature on a device under test and a cascade of devices.Based on a measurement example the user will be guided through the process of setting up a noise figure channel and performing a noise figure measurement. In addition, various measurement options are reviewed, providing guidance as to when and how each option should be utilized to improve the noise figure results.
23-Dec-2021 | AN-No. 1SL378
The R&S®ZNA vector network analyzer with integrated LO output and direct IF input options is a simple, cost-effective solution for 2-port and 4-port measurements using Rohde & Schwarz mmWave converters.
19-Jul-2021
Vector network analyzers are the most accurate instruments in the microwave engineer’s lab. The R&S®ZNA takes accuracy to a new level. Not only is the instrument extremely precise, but now it also calculates and displays the measurement uncertainty right on the screen as the device under test is being measured.
19-Jul-2021
This application note describes Methods of Implementations (MOI) for precise, fast and error-free compliance testing of high-speed backplanes and direct attach copper cables (DAC) according to InfiniBand EDR and HDR specifications, based on 25 Gb/s and 50 Gb/s signaling per lane with vector network analyzers from Rohde & Schwarz.
07-Apr-2021 | AN-No. GFM357
This application note describes Methods of Implementations (MOI) for precise, fast and error-free compliance testing of high-speed backplanes and direct attach copper cables (DAC) according to IEEE 802.3bj, IEEE 802.3by, IEEE 802.3cd and IEEE 802.3ck, based on 25 Gb/s, 50 Gb/s and 100 Gb/s signaling per lane with vector network analyzers from Rohde & Schwarz.
07-Apr-2021 | AN-No. GFM356
PAM-4 (4-level pulse amplitude modulation) has been introduced in high-speed serial data technology to reduce the bandwidth demands of ultra-high data rates. It uses only half the bandwidth per bit that would be required of conventional NRZ (non-return to zero) modulation. But at the same time, PAM-4 signaling complicates design and test at every turn. Evaluation of channels is now just as important to system development as serializer / deserializer (SerDes) testing and the challenges presented require a higher level of test and measurement performance than ever before. This paper investigates the evaluation complexities of PAM-4 interconnects at high data rates.
22-Oct-2020 | AN-No. GFM355
Load pull is a powerful method for characterizing RF power amplifiers through impedance variation. Load pull enables model extraction and validation as well as performance, ruggedness and efficiency testing.
02-Sep-2020
Vector Network Analyzers of t ZNA and ZNB family are able to measure magnitude and phase of complex S-parameters of a device under test (DUT) in the frequency domain. By means of the inverse Fourier transform the measurement results can be transformed to the time domain. Thus, the impulse or step response of the DUT is obtained, which gives an especially clear form of representation of its characteristics. For instance, faults in cables can thus be directly localized. Moreover, special time domain filters, so-called gates, are used to suppress unwanted signal components such as multireflections. The measured data "gated" in the time domain are then transformed back to the frequency domain and an Sparameter representation without the unwanted signal components is obtained as a function of frequency. As usual, other complex or scalar parameters such as impedance or attenuation can then be calculated and displayed.
30-Jul-2020 | AN-No. 1EP83
Many applications in aerospace and defense as well as in mobile communication require a defined magnitude and phase relation between several signals, for example, to design a smart antenna array and it's distribution network, or to ensure accurate phase alignment between different transmitter or receiver chains of T/R modules. Magnitude can be measured with spectrum analyzers or power meters. For phase measurements, a vector network analyzer is the easiest, fastest and most accurate instrument.This application note shows how to measure the phase accurately between several signals using vector network analyzers of the R&S®ZNA, R&S®ZNB and R&S®ZNBT families.
11-Jul-2019 | AN-No. 1EZ82
Frequency converters e.g. in satellite transponders need to be characterized not only in terms of amplitude transmission but also in terms of phase transmission or group delay, especially with the transition to digital modulation schemes. They often do not provide access to the internal local oscillators. This application note describes a method using the R&S®ZNA analyzer family to measure group delay of mixers and frequency converters with an embedded local oscillator very accurately. The key aspect of this new technique is that the network analyzer applies a 2-tone signal to the frequency converter. By measuring the phase differences between the two signals at the input and at the output, it calculates group delay and relative phase.
11-Jul-2019 | AN-No. 1EZ81
The R&S®ZNA vector network analyzer offers a dynamic range that is unbeatable on the market. This kind of sensitivity unlocks potential applications that previously could not be addressed with a vector network analyzer.
07-Jan-2019
Versatile Software Tool for Rohde & Schwarz Instruments
RSCommander is a versatile software tool for a wide range of Rohde & Schwarz spectrum-, network analyzers, signal generators and oscilloscopes. It allows for automatic instrument discovery, making screenshots, reading traces, file transfer and simple script creation.
24-Dec-2017 | AN-No. 1MA074