Oscillator, clock and PLL testing

Oscillator, clock and PLL testing

Oscillator output signal characterization

Oscillators are used in both analog and digital designs. They work as clocks for digital designs or local oscillators (LO) to reach the target RF frequency through up- or downconversion.

Oscillators have various different topologies, ranging from crystal synthesizer based PLL designs to DDS techniques. Either way, the output signals have to be characterized and tested to make sure the device or module meets the design specifications for clock accuracy, signal purity and stability.

Rohde & Schwarz provides solutions to test any oscillator using oscilloscopes, spectrum analyzers, phase noise analyzers and VCO testers.

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Voltage controlled oscillator (VCO) characterizations
Voltage controlled oscillator (VCO) characterizations
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Voltage controlled oscillator (VCO) characterizations

Voltage controlled oscillators (VCOs) are oscillators where a defined input signal is controlling the output frequency. With the launch of the R&S®FSPN, Rohde & Schwarz is adding a new member to the phase noise analyzer portfolio, enabling increased efficiency and reproducibility of phase noise measurements and VCO characterization from lab to production.

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Understanding phase noise measurement techniques

Understanding phase noise measurement techniques

Phase noise can be measured using traditional spectrum analyzers as well as dedicated phase noise analyzers. This whitepaper explains the difference between these two methodologies and in particular, how the cross-correlation method improves both the sensitivity and accuracy of phase noise measurements.

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Understanding phase noise fundamentals

Understanding phase noise fundamentals

Learn more about phase noise and its role in oscillators. Get a brief technical introduction to phase noise concepts as well as an overview of how phase noise is measured and reported.

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Tips and tricks to reduce duration of phase noise measurements

Tips and tricks to reduce duration of phase noise measurements

The Rohde & Schwarz®FSWP (FSWP) is a modern, digital signal processing based, phase-noise test set that performs many tasks in parallel in an effort to improve measurements speed. However, several measurement settings drastically affect measurement speed. This paper will discuss these settings and provide suggestions on improving overall measurement speed.

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Verifying the true jitter performance of clocks in high-speed digital designs

Verifying the true jitter performance of clocks in high-speed digital designs

To minimize EMI effects, technologies like PCIe, USB and HDMI™ typically use spread spectrum clocking (SSC), applying a low-frequency FM to the reference clock. Since SSC puts additional stress on the clock, clock jitter also needs to be verified in SSC ON mode.

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Verifying additive phase noise and jitter attenuation of PLLs in high-speed digital designs

Verifying additive phase noise and jitter attenuation of PLLs in high-speed digital designs

Increasing data rates require SerDes PLLs and clock synthesizers with low additive phase noise and high jitter attenuation. Modern designs often follow a two-stage architecture, consisting of a jitter-attenuator and a frequency-synthesizer stage.

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Verifying the clock source

Verifying the clock source

The signal purity of clock sources has a direct impact on system performance. To ensure proper operation, it is necessary to verify that the purity meets the requirements for the analog and digital circuit designs.

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A 1 MHz to 50 GHz Direct Down-Conversion Phase Noise Analyzer with Cross-Correlation

A 1 MHz to 50 GHz Direct Down-Conversion Phase Noise Analyzer with Cross-Correlation

A new phase noise test instrument covers the frequency range from 1 MHz to 50 GHz with direct down-conversion analog I/Q mixers and baseband signal sampling. The traditional PLL has been replaced by a digital FM demodulator for phase detection and frequency tracking.

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Comparison of jitter measurements in the time and frequency domain

Comparison of jitter measurements in the time and frequency domain

When analyzing the robustness of data transmission systems, jitter is a key performance indicator. To achieve great sensitivity and differentiate between fast and slow artifacts with jitter measurements, the use of both time and frequency domain solutions is recommended.

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When you need an ideal clock source

When you need an ideal clock source

Today's digital designs and data converters with high rates require clean clocks with minimal jitter. Modern digital designs and data converters can only work as well as the applied clock source allows. See how to get the best performance by using a state-of-the-art clock source.

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Related products

R&S®FSWP phase noise analyzer and VCO tester

R&S®FSWP phase noise analyzer and VCO tester

The R&S®FSWP phase noise analyzer and VCO tester combines extremely low‑noise internal sources and cross‑correlation technology, delivering extremely high sensitivity for phase noise measurements.

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R&S®SMA100B RF and microwave signal generator

R&S®SMA100B RF and microwave signal generator

The R&S®SMA100B RF and microwave signal generator delivers purest output signals while maintaining the highest output power level. As the world's leading signal generator, it can handle the most demanding component, module and system T&M tasks.

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R&S®RTP oscilloscope

R&S®RTP oscilloscope

The R&S®RTP high-performance oscilloscope combines high signal integrity with a fast acquisition rate. Customized frontend ASICs and realtime processing hardware enable highly accurate measurements with unprecedented speed in a compact form factor.

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R&S®RTO2000 oscilloscope

R&S®RTO2000 oscilloscope

Offering bandwidths from 600 MHz to 6 GHz, R&S®RTO2000 oscilloscopes excel at both time domain and frequency domain testing. Their excellent signal fidelity, responsiveness of 1 million waveforms/s and up to 16-bit vertical resolution lets you measure quickly with confidence.

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Related videos

First class ADCs thanks to first class signals

First class ADCs thanks to first class signals

This video presents how the R&S®SMA100B supports you in measuring the true performance of ADCs. The R&S®SMA100B provides you with purest signals. This makes ADC testing easy and helps you improving your products.

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Signals with lowest phase noise

R&S®SMA100B - Signals with lowest phase noise

Radar engineering, data converter testing, base station blocking tests - all of them require signals with lowest phase noise at the relevant offset frequencies.

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Demystifying 5G – Phase noise of clock and LO components in 5G base stations

Demystifying 5G – Phase noise of clock and LO components in 5G base stations

The video demonstrates a clock generator and an RF synthesizer from IDT and shows the measurement of the phase noise, contributed by these components.

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Spurious measurements

Spurious measurements

Fast and reliable detection of spurious emissions with R&S®FSW. In order to measure the low levels of spurious emissions, it is often necessary to reduce the resolution bandwidth, which increases the measurement time.

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Phase noise of local oscillators

Phase noise of local oscillators in 5G base stations

Phase noise performance of local oscillators is critical for up- and down-converters of 5G base station transceivers. See how to achieve excellent phase noise measurement results of IDT’s microwave synthesizer with low noise signal generator R&S SMA100B and phase noise analyzer R&S FSWP.

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Timing alignment and delay adjustment of sampling clocks

Timing alignment and delay adjustment of sampling clocks in 5G base stations

ADC’s and DAC’s of 5G base station transceivers require excellent clock signals aligning time and adjusting delays. Learn how to verify the performance of IDT’s RF sampling clock generator / jitter attenuator with low noise signal generator R&S SMA100B and high-performance oscilloscope R&S RTP.

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Clock input monitoring, holdover and relocking with sampling clocks

Clock input monitoring, holdover and relocking with sampling clocks in 5G base stations

Monitoring and relocking clock inputs are critical for the performance and the timing of 5G base station transceivers. See how to measure the relocking period parameters of IDT’s RF sampling clock generator / jitter attenuator with vector signal generator R&S SMW200A incl. phase noise profile option and high-performance spectrum and phase noise analyzer R&S FSWP.

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Related solutions

Passive component testing

Passive component testing

Passive components include a large variety of building blocks for RF and digital designs. These range from RF filters and combiners, switches, couplers to cables, connectors and PCB boards.

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Mixer & frequency converter testing

Mixer & frequency converter testing

Mixers are a fundamental element in a wide range of applications such as modulators, phase detectors, frequency converters and synthesizers in many RF and microwave systems. They are a standard building block in wireless communications systems and radar systems.

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